Atomic force Microscope AFM Nano inden 125191594

The Department of Defence has published a tender for "Atomic force Microscope (AFM),Nano indenter,Micro hardness tester,X-Ray Diffraction (XRD),Optical Profiler,Confocal Microscope,Raman Microscope,Spectroscopic Ellipsometer,Fourier - transform Infrared spectroscopy( FTIR),Energy dispersive spectrometry (EDX) & electron backscattered diffraction (EBSD),Co-Ordinate measuring Machine (CMM),Form Tester,Stereo Microscopy,Sample Preparation,Surface roughness tester (contact type)" on the 04 Aug 2025. This tender belongs to Roughness Tester category. This tender is published in Bangalore, Karnataka location. The vendors interested in this tender and related Roughness Tester tenders can obtain further details by exploring Tendersniper web portal. Tendersniper sends regular tender alerts by email specifically addressing the user requirements (i.e., keywords, location and value range). Government business is a growing area of opportunity. The businesses are encouraged to actively monitor tender opportunities and participate in them to grow their business.
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