The Indian Institute of Technology Bombay has published a tender for "MOCVD epitaxy structure" on the 02 Mar 2026. This tender belongs to Semiconductor wafers category. This tender is published in Thane, Maharashtra location. The vendors interested in this tender and related Semiconductor wafers tenders can obtain further details by exploring Tendersniper web portal. Tendersniper sends regular tender alerts by email specifically addressing the user requirements (i.e., keywords, location and value range). Government business is a growing area of opportunity. The businesses are encouraged to actively monitor tender opportunities and participate in them to grow their business.
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In Thane district, Maharashtra, a total of 2 Semiconductor wafers tenders have been published, with
| Tender Title | MOCVD epitaxy structure |
|---|---|
| Tender Description | mocvd epitaxy structure: gan hemtmocvd epitaxy structure: gan hemt on 4” sic substrate productspecification: an mocvd epitaxy structure: gan hemt structure on 4” sicepi structure specification: o thickness uniformity <(><<)> 5%; o xrd r.c.002 fwhm<(><<)>=0.1deg; o epd <(><<)>= 1*10^9/cm2; o channelresistivity <(><<)>= 350 ohm*cm; gan hemt epi-structure: cap layer gan;2-3nm; alxgan(1-x) spacer; 25nm, x=25%; aln spacer; 0.8nm; undopedgan hemt layer; 3μm; aln; 40nm; si 6h-sic substrate, 4-inch; substratespecification: o si-type 6h-sic substrate; o mpd<(><<)>5/cm2, primegrade; o diameter: 100mm (4”); o thickness 500μm (±25μm); o waferorientation <(><<)>0001>, off-cut 0.5deg, single side polished; o edgeexclusion: 1mm; o warp: <(><<)> 35 μm; o bow: <(><<)> 20 μm; o ttv: <(><<)> 10 μm; o resistivity >= 1.0*10^11 ohm*cm; |
| Comments | mocvd epitaxy structure: gan hemtmocvd epitaxy structure: gan hemt on 4” sic substrate productspecification: an mocvd epitaxy structure: gan hemt structure on 4” sicepi structure specification: o thickness uniformity <(><<)> 5%; o xrd r.c.002 fwhm<(><<)>=0.1deg; o epd <(><<)>= 1*10^9/cm2; o channelresistivity <(><<)>= 350 ohm*cm; gan hemt epi-structure: cap layer gan;2-3nm; alxgan(1-x) spacer; 25nm, x=25%; aln spacer; 0.8nm; undopedgan hemt layer; 3μm; aln; 40nm; si 6h-sic substrate, 4-inch; substratespecification: o si-type 6h-sic substrate; o mpd<(><<)>5/cm2, primegrade; o diameter: 100mm (4”); o thickness 500μm (±25μm); o waferorientation <(><<)>0001>, off-cut 0.5deg, single side polished; o edgeexclusion: 1mm; o warp: <(><<)> 35 μm; o bow: <(><<)> 20 μm; o ttv: <(><<)> 10 μm; o resistivity >= 1.0*10^11 ohm*cm; |
| Published Date | |
|---|---|
| Due Date | 09 Mar 2026 00:00:00 |
| Estimated Value | 0.0 |
|---|---|
| EMD | 0 INR |
| Processing Fee | 0 INR |